Home  
About Us  
Products  
Services
Contact Us

 

 

 

Dielectric Measurement Service

As high-speed and broadband communication systems become more and more common, there are greater demands for high-efficiency materials, especially dielectric materials having sufficient transmission characteristics. To meet these demands, it's pivotal to analyze characteristics of materials, especially to perform dielectric measurements. AET, Inc. with our experience and expertise in the fields of microwave and millimeter-wave, provides you with services for dielectric measurements.


Dielectric Measurement Service

Until now, measurements of the dielectric properties depend on the approximate calculations that are based on the perturbation theory. The dielectric measurement service offered by AET, Inc. uses a high Q cavity and 3D electromagnetic field simulation technique into the process of measuring the dielectric properties. This allows us to accurately compute the complex value of relative dielectric properties of a sample. We select the most suitable measurement method according to the size and shape of a sample material, and provide the measurement for almost all forms of samples including solid, sheet, film, multi-layered circuit board, particle and liquid.

Measurement by a
resonant chamber
Applications:

  • Substrate materials for high-speed digital and microwave circuits
  • Low loss dielectrics used for filters and dielectric antenna
  • Thin film materials
  • Semiconductor materials
  • Medical Electronics
  • Chemicals
  • Foods(moisture content)
  • Body tissues
  • Gases
  • Liquids

 

Measuring Methods


Measuring Methods Material shapes Materials Frequency Features
Open Coaxial Resonator Free Solid,
Liquid
800MHz-
18GHz
Non-destructive measurement of the permittivity of thin-films down to 50µm in microwave range.
Resonant Cavity Small-size
Cylinder /
Prism,
Thin Film
Solid,
Liquid,
Particle
1GHz -
50GHz
Accurate but destructive measurement in the microwave and millimeter wave range.
Stripline Resonator Plate,
Thin Film
Solid 1GHz -
18GHz
Measurement of the material of a printed circuit board while in use.
Coaxial Reflection Free Liquid,
etc.
200MHz -
40GHz
Measurement of continuous dielectric properties in broad band.
Capacitance Plate Solid 10MHz -
1GHz
Measurement of continuous dielectric properties.
 


Highly Accurate Simulation by MW STUDIO


   
Copyright © AET-TECH Inc. All rights reserved.